Research on Crisis Propagation Effect in International Trade Network Based on Cascading Failure Model:Take Semiconductors as an Example

YIN Xiaoxiao, TAO Yewei, ZHAO Xiaoqian, SHI Lei

Journal of Systems Science and Mathematical Sciences ›› 2024, Vol. 44 ›› Issue (5) : 1389-1411.

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中国科学院数学与系统科学研究院期刊网
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Journal of Systems Science and Mathematical Sciences ›› 2024, Vol. 44 ›› Issue (5) : 1389-1411. DOI: 10.12341/jssms23865

Research on Crisis Propagation Effect in International Trade Network Based on Cascading Failure Model:Take Semiconductors as an Example

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{{article.zuoZheEn_L}}. {{article.title_en}}. Journal of System Science and Mathematical Science Chinese Series, 2024, 44(5): 1389-1411 https://doi.org/10.12341/jssms23865

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