Research on Crisis Propagation Effect in International Trade Network Based on Cascading Failure Model:Take Semiconductors as an Example

YIN Xiaoxiao, TAO Yewei, ZHAO Xiaoqian, SHI Lei

Journal of Systems Science and Mathematical Sciences ›› 2024, Vol. 44 ›› Issue (5) : 1389-1411.

PDF(8744 KB)
中国科学院数学与系统科学研究院期刊网
PDF(8744 KB)
Journal of Systems Science and Mathematical Sciences ›› 2024, Vol. 44 ›› Issue (5) : 1389-1411. DOI: 10.12341/jssms23865

Research on Crisis Propagation Effect in International Trade Network Based on Cascading Failure Model:Take Semiconductors as an Example

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}. Journal of System Science and Mathematical Science Chinese Series, 2024, 44(5): 1389-1411 https://doi.org/10.12341/jssms23865

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(8744 KB)

Accesses

Citation

Detail
Sections
Recommended

/

〈 〉