Research on ELM Fault Diagnosis of Analog Circuit Based on KSLPP Feature Extraction

WANG Chunlan, GAN Xusheng, LI Shuangfeng, MENG Xiangwei

Journal of Systems Science and Mathematical Sciences ›› 2020, Vol. 40 ›› Issue (9) : 1662-1671.

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中国科学院数学与系统科学研究院期刊网
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Journal of Systems Science and Mathematical Sciences ›› 2020, Vol. 40 ›› Issue (9) : 1662-1671. DOI: 10.12341/jssms13971

Research on ELM Fault Diagnosis of Analog Circuit Based on KSLPP Feature Extraction

  • WANG Chunlan1 ,GAN Xusheng2 ,LI Shuangfeng2, MENG Xiangwei2
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{{article.zuoZheEn_L}}. {{article.title_en}}. Journal of Systems Science and Mathematical Sciences, 2020, 40(9): 1662-1671 https://doi.org/10.12341/jssms13971

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