Research on ELM Fault Diagnosis of Analog Circuit Based on KSLPP Feature Extraction

WANG Chunlan, GAN Xusheng, LI Shuangfeng, MENG Xiangwei

Journal of System Science and Mathematical Science Chinese Series ›› 2020, Vol. 40 ›› Issue (9) : 1662-1671.

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中国科学院数学与系统科学研究院期刊网
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Journal of System Science and Mathematical Science Chinese Series ›› 2020, Vol. 40 ›› Issue (9) : 1662-1671. DOI: 10.12341/jssms13971

Research on ELM Fault Diagnosis of Analog Circuit Based on KSLPP Feature Extraction

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{{article.zuoZheEn_L}}. {{article.title_en}}. Journal of Systems Science and Mathematical Sciences, 2020, 40(9): 1662-1671 https://doi.org/10.12341/jssms13971

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