ASSESSING OCCUPATIONAL EXPOSURE VIA THE TWO-WAY RANDOM EFFECTS MODEL

Mu Weiyan ;Xu Xingzhong;Xiong Shifeng

Journal of System Science and Mathematical Science Chinese Series ›› 2007, Vol. 27 ›› Issue (1) : 134-144.

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Journal of System Science and Mathematical Science Chinese Series ›› 2007, Vol. 27 ›› Issue (1) : 134-144. DOI: 10.12341/jssms08731
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ASSESSING OCCUPATIONAL EXPOSURE VIA THE TWO-WAY RANDOM EFFECTS MODEL

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