$H^1$ Error Estimates for the Finite Volume Element Method Along Characteristics for Two Dimensional Semiconductor Device with Heat Conduction

LONG Xiaohan;CHEN Chuanjun

Journal of Systems Science and Mathematical Sciences ›› 2009, Vol. 29 ›› Issue (5) : 706-720.

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中国科学院数学与系统科学研究院期刊网
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Journal of Systems Science and Mathematical Sciences ›› 2009, Vol. 29 ›› Issue (5) : 706-720. DOI: 10.12341/jssms08410
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$H^1$ Error Estimates for the Finite Volume Element Method Along Characteristics for Two Dimensional Semiconductor Device with Heat Conduction

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{{article.zuoZheEn_L}}. {{article.title_en}}. Journal of Systems Science and Mathematical Sciences, 2009, 29(5): 706-720 https://doi.org/10.12341/jssms08410

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